Tests:
Attribute Services --> Attribute Write Values:
Test case 03 Write to a single node multiple times in the same call
Test case 05 Write the minimum value for each supported Data Types.

DUT setup values:
ByteString max value: 0xff
ByteString min value: 0x00
ByteString default value: 0x97

Note: Null ByteString is not supported by the DUT.

When running TC 03 the CTT tests to write Null ByteString 5 times and the DUT answer with BadWriteNotSupported (0x80730000). Then the test is trying to verify the previously written value but since the DUT not accepted the value, there is a missmatch and the CTT raises an error with the following text: "Expected a value that was previously written. According to the specification a write should return after the write operation has been completed otherwise the server needs to return a Good_CompletesAsynchronously.". Should not the test take into account that there may not be support for null bytestring in the same way it is handled in test case 06* (question mark symbol and the text "Server indicate a lack of support for the requested write operation..." )?

When running TC 05 the CTT tests to write a Null ByteString and the DUT answer with BadWriteNotSupported (0x80730000). The CTT raises an error because it expected Good (0x00000000) or BadOutOfRange (0x803c0000). Should not the test take into account that there may not be support for null bytestring in the same way it is handled in test case 06* (question mark symbol and the text "Server indicate a lack of support for the requested write operation..." ) and a check against BadWriteNotSupported (0x80730000) instead of BadOutOfRange (0x803c0000)?

*Test case 06 - Write max value of each supported data type.