As a process operator of a machine at a manufacturing plant I want the diagnostics for all of the components in my system to be automatically aggregated into a single user view. I want to be able to filter this view to isolate network diagnostics, component diagnostics and application diagnostics. Where there is time available, in the device (and I know that not all devices will support time), I want it to be presented as a common wall clock time and I want any timestamps to be generated at the lowest level in the architecture where time is available in the system and for that time to be maintained with the diagnostic.

This story requires a significant level of integration between the CIP plant level technology and the OPC UA ‘up-link’ technology. Some of this integration may require extensions to the CIP protocol to be made possible and others may result in conformance-testable gateway functionality.